"Novel fully silicided ballasting and MFT design techniques for ESD ..."

Koen G. Verhaege, Christian C. Russ (2001)

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DOI: 10.1016/S0026-2714(01)00030-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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Koen G. Verhaege, Christian C. Russ:
Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies. Microelectron. Reliab. 41(11): 1739-1749 (2001)

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