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"Frequency domain scanning acoustic microscopy for power electronics: ..."

Christian Uhrenfeldt, Stig Munk-Nielsen, Szymon Beczkowski (2018)

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DOI: 10.1016/J.MICROREL.2018.07.043

access: closed

type: Journal Article

metadata version: 2024-05-07

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Christian Uhrenfeldt, Stig Munk-Nielsen, Szymon Beczkowski:
Frequency domain scanning acoustic microscopy for power electronics: Physics-based feature identification and selectivity. Microelectron. Reliab. 88-90: 726-732 (2018)

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