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"Thermal stress probing the channel-length modulation effect of nano n-type ..."

Fu-Yuan Tuan et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.06.067

access: closed

type: Journal Article

metadata version: 2022-10-02

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Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan:
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectron. Reliab. 83: 260-270 (2018)

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