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"Structural design optimization for board-level drop reliability of ..."
Tsung-Yueh Tsai et al. (2008)
- Tsung-Yueh Tsai, Yi-Shao Lai, Chang-Lin Yeh, Rong-Sheng Chen:
Structural design optimization for board-level drop reliability of wafer-level chip-scale packages. Microelectron. Reliab. 48(5): 757-762 (2008)
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