Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"An investigation into warpages, stresses and keep-out zone in 3D ..."

Ming-Yi Tsai et al. (2014)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2014.08.017

access: closed

type: Journal Article

metadata version: 2024-05-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/TsaiHHLHCSL14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/TsaiHHLHCSL14
Ming-Yi Tsai, P. S. Huang, C. Y. Huang, P. C. Lin, Lawrence Huang, Michael Chang, Steven Shih, J. P. Lin:
An investigation into warpages, stresses and keep-out zone in 3D through-silicon-via DRAM packages. Microelectron. Reliab. 54(12): 2898-2904 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.