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"Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ..."

Mohamed Tlig, Jaleleddine Ben Hadj Slama, Mohamed Ali Belaïd (2013)

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DOI: 10.1016/J.MICROREL.2013.07.111

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Tlig, Jaleleddine Ben Hadj Slama, Mohamed Ali Belaïd:
Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests. Microelectron. Reliab. 53(9-11): 1793-1797 (2013)

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