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"MEMS packaging and reliability: An undividable couple."

Harrie A. C. Tilmans et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.029

access: closed

type: Journal Article

metadata version: 2023-04-20

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  - https://dblp.org/rec/journals/mr/TilmansCHCJMVPZWW12
Harrie A. C. Tilmans, Jeroen De Coster, Philippe Hélin, Vladimir Cherman, Anne Jourdain, Piet De Moor, Bart Vandevelde, Nga P. Pham, Joseph Zekry, Ann Witvrouw, Ingrid De Wolf:
MEMS packaging and reliability: An undividable couple. Microelectron. Reliab. 52(9-10): 2228-2234 (2012)

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