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"Time-dependent dielectric breakdown of SiO2 films in a wide ..."
Akinobu Teramoto et al. (2001)
- Akinobu Teramoto
, H. Umeda, K. Azamawari, Kiyoteru Kobayashi
, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi:
Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. Microelectron. Reliab. 41(1): 47-52 (2001)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
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