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"Accurate negative bias temperature instability lifetime prediction based ..."
Akinobu Teramoto et al. (2008)
- Akinobu Teramoto
, Rihito Kuroda
, Shigetoshi Sugawa, Tadahiro Ohmi:
Accurate negative bias temperature instability lifetime prediction based on hole injection. Microelectron. Reliab. 48(10): 1649-1654 (2008)
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