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"Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film ..."

Dimitrios H. Tassis et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.03.010

access: closed

type: Journal Article

metadata version: 2022-09-13

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Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos:
Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. Microelectron. Reliab. 46(12): 2032-2037 (2006)

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