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"Overdriving reliability of chip scale packaged LEDs: Quantitatively ..."
Hongyu Tang et al. (2017)
- Hongyu Tang, Huaiyu Ye, Cell K. Y. Wong, Stanely Y. Y. Leung, Jiajie Fan, Xianping Chen, Xuejun Fan, Guoqi Zhang:
Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component. Microelectron. Reliab. 78: 197-204 (2017)
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