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"Read disturb in flash memories: reliability case."

P. Tanduo et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.007

access: closed

type: Journal Article

metadata version: 2022-04-21

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P. Tanduo, Luca Cola, S. Testa, M. Menchise, A. Mervic:
Read disturb in flash memories: reliability case. Microelectron. Reliab. 46(9-11): 1439-1444 (2006)

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