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"Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation."

Wing-Shan Tam et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.060

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong:
Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation. Microelectron. Reliab. 51(12): 2064-2068 (2011)

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