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"Statistics of soft and hard breakdown in thin SiO2 gate oxides."
Jordi Suñé et al. (2003)
- Jordi Suñé, Ernest Y. Wu, David Jiménez, Wing L. Lai:
Statistics of soft and hard breakdown in thin SiO2 gate oxides. Microelectron. Reliab. 43(8): 1185-1192 (2003)
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