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"On thermo-mechanical reliability of plated-through-hole (PTH)."

Fei Su et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.11.021

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/SuMXZZSX12
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  - https://dblp.org/rec/journals/mr/SuMXZZSX12
Fei Su, Ronghai Mao, Ji Xiong, Kun Zhou, Zheng Zhang, Jiang Shao, Cunyi Xie:
On thermo-mechanical reliability of plated-through-hole (PTH). Microelectron. Reliab. 52(6): 1189-1196 (2012)

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