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"Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications."
Antonio Stocco et al. (2014)
- Antonio Stocco, Stefano Dalcanale, Fabiana Rampazzo, Matteo Meneghini
, Gaudenzio Meneghesso, Jan Grünenpütt, Benoit Lambert, Hervé Blanck, Enrico Zanoni
:
Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications. Microelectron. Reliab. 54(9-10): 2237-2241 (2014)
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