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"Reliability evaluation of IGCT from accelerated testing, quality ..."

Th. Stiasny et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.079

access: closed

type: Journal Article

metadata version: 2020-02-22

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Th. Stiasny, Olivier Quittard, Daniel Waltisberg, U. Meier:
Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis. Microelectron. Reliab. 88-90: 510-513 (2018)

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