"The negative bias temperature instability in MOS devices: A review."

James H. Stathis, Sufi Zafar (2006)

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DOI: 10.1016/J.MICROREL.2005.08.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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James H. Stathis, Sufi Zafar:
The negative bias temperature instability in MOS devices: A review. Microelectron. Reliab. 46(2-4): 270-286 (2006)

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