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"Circuit implications of gate oxide breakdown."
James H. Stathis, Rosana Rodríguez, Barry P. Linder (2003)
- James H. Stathis
, Rosana Rodríguez, Barry P. Linder:
Circuit implications of gate oxide breakdown. Microelectron. Reliab. 43(8): 1193-1197 (2003)

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