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"Reliability of ultra-thin oxides in CMOS circuits."

James H. Stathis et al. (2003)

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DOI: 10.1016/S0026-2714(03)00242-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/StathisLRL03
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  - https://dblp.org/rec/journals/mr/StathisLRL03
James H. Stathis, Barry P. Linder, Rosana Rodríguez, Salvatore Lombardo:
Reliability of ultra-thin oxides in CMOS circuits. Microelectron. Reliab. 43(9-11): 1353-1360 (2003)

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