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"Lifetime tests of 600-V GaN-on-Si power switches and HEMTs."
K. V. Smith et al. (2016)
- K. V. Smith, J. Haller, Josep M. Guerrero
, R. P. Smith, R. Lal, YiFeng Wu:
Lifetime tests of 600-V GaN-on-Si power switches and HEMTs. Microelectron. Reliab. 58: 197-203 (2016)
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