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"A novel analytical method for defect tolerance assessment."

Mariem Slimani, Arwa Ben Dhia, Lirida A. B. Naviner (2015)

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DOI: 10.1016/J.MICROREL.2015.06.059

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mariem Slimani, Arwa Ben Dhia, Lirida A. B. Naviner:
A novel analytical method for defect tolerance assessment. Microelectron. Reliab. 55(9-10): 1285-1289 (2015)

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