"A hybrid prognostics approach for MEMS: From real measurements to ..."

Haithem Skima et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.142

access: closed

type: Journal Article

metadata version: 2020-02-22

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Haithem Skima, Kamal Medjaher, Christophe Varnier, Eugen Dedu, Julien Bourgeois:
A hybrid prognostics approach for MEMS: From real measurements to remaining useful life estimation. Microelectron. Reliab. 65: 79-88 (2016)

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