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"Novel failure mode of chip corrosion at automotive HALL sensor devices ..."

Michél Simon-Najasek et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.008

access: closed

type: Journal Article

metadata version: 2024-05-07

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Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann:
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectron. Reliab. 64: 248-253 (2016)

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