default search action
"Gate delay variability estimation method for parametric yield improvement ..."
Digeorgia N. da Silva, André Inácio Reis, Renato P. Ribas (2010)
- Digeorgia N. da Silva, André Inácio Reis, Renato P. Ribas:
Gate delay variability estimation method for parametric yield improvement in nanometer CMOS technology. Microelectron. Reliab. 50(9-11): 1223-1229 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.