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"Gate delay variability estimation method for parametric yield improvement ..."

Digeorgia N. da Silva, André Inácio Reis, Renato P. Ribas (2010)

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DOI: 10.1016/J.MICROREL.2010.07.071

access: closed

type: Journal Article

metadata version: 2020-02-22

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Digeorgia N. da Silva, André Inácio Reis, Renato P. Ribas:
Gate delay variability estimation method for parametric yield improvement in nanometer CMOS technology. Microelectron. Reliab. 50(9-11): 1223-1229 (2010)

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