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"Instability of oxide thin film transistor under electrical-mechanical ..."

Dongseok Shin, Min Soo Bae, Ilgu Yun (2016)

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DOI: 10.1016/J.MICROREL.2016.07.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dongseok Shin, Min Soo Bae, Ilgu Yun:
Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display. Microelectron. Reliab. 64: 109-112 (2016)

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