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"New substrate-triggered ESD protection structures in a 0.18-µm CMOS ..."

Yi Shan, John He, Wen Huang (2009)

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DOI: 10.1016/J.MICROREL.2008.10.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yi Shan, John He, Wen Huang:
New substrate-triggered ESD protection structures in a 0.18-µm CMOS process without extra mask. Microelectron. Reliab. 49(1): 17-25 (2009)

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