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"Fault diagnosis technology based on transistor behavior analysis for ..."

Masaru Sanada, Yutaka Yoshizawa (2006)

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DOI: 10.1016/J.MICROREL.2006.07.023

access: closed

type: Journal Article

metadata version: 2022-11-07

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Masaru Sanada, Yutaka Yoshizawa:
Fault diagnosis technology based on transistor behavior analysis for physical analysis. Microelectron. Reliab. 46(9-11): 1575-1580 (2006)

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