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"Reduced temperature dependence of hot carrier degradation in deuterated ..."
Cora Salm et al. (2006)
- Cora Salm
, André J. Hof, Fred G. Kuper, Jurriaan Schmitz
:
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectron. Reliab. 46(9-11): 1617-1622 (2006)
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