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"Reliability aspects of a radiation detector fabricated by post-processing ..."

Cora Salm et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.038

access: closed

type: Journal Article

metadata version: 2021-10-14

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Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz:
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectron. Reliab. 48(8-9): 1139-1143 (2008)

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