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"Lifetime of power electronics interconnections in accelerated test ..."

Wissam Sabbah et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.091

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SabbahAABTM17
Wissam Sabbah, Faical Arabi, Oriol Avino-Salvado, Cyril Buttay, L. Théolier, Hervé Morel:
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. Microelectron. Reliab. 76-77: 444-449 (2017)

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