"New insights on the PBTI phenomena in SiON pMOSFETs."

Karina Rott et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.015

access: closed

type: Journal Article

metadata version: 2022-02-04

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Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser:
New insights on the PBTI phenomena in SiON pMOSFETs. Microelectron. Reliab. 52(9-10): 1891-1894 (2012)

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