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"Reliability challenges in the nanoelectronics era."

A. J. van Roosmalen, G. Q. Zhang (2006)

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DOI: 10.1016/J.MICROREL.2006.07.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/RoosmalenZ06
A. J. van Roosmalen, G. Q. Zhang:
Reliability challenges in the nanoelectronics era. Microelectron. Reliab. 46(9-11): 1403-1414 (2006)

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