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"Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under ..."

Nicolo Ronchi et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nicolo Ronchi, Franco Zanon, Antonio Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. Microelectron. Reliab. 49(9-11): 1207-1210 (2009)

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