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"Leakage current and defect characterization of p+n-source/drain ..."

Guntrade Roll, Matthias Goldbach, Lothar Frey (2011)

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DOI: 10.1016/J.MICROREL.2011.05.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Guntrade Roll, Matthias Goldbach, Lothar Frey:
Leakage current and defect characterization of p⁺n-source/drain diodes. Microelectron. Reliab. 51(12): 2081-2085 (2011)

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