"Improved current filament control during Zener diode zapping."

Jaume Roig et al. (2012)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2012.06.144

access: closed

type: Journal Article

metadata version: 2021-03-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/RoigLVMB12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/RoigLVMB12
Jaume Roig, Julien Lebon, Steven Vandeweghe, Samir Mouhoubi, Filip Bauwens:
Improved current filament control during Zener diode zapping. Microelectron. Reliab. 52(9-10): 2368-2373 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.