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"Thermal resistance assessment in multi-trenched power devices."

Jaume Roig et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.031

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jaume Roig, B. Desoete, Filip Bauwens, F. Lovadina, Peter Moens:
Thermal resistance assessment in multi-trenched power devices. Microelectron. Reliab. 48(8-9): 1479-1484 (2008)

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