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"Fast and accurate method of lifetime estimation for HfSiON/SiO2 ..."
Giyoun Roh et al. (2017)
- Giyoun Roh, Hyeokjin Kim, Cheolgyu Kim, Dongwoo Kim
, Bongkoo Kang:
Fast and accurate method of lifetime estimation for HfSiON/SiO2 dielectric n-MOSFETs under positive bias temperature instability. Microelectron. Reliab. 72: 98-102 (2017)
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