"Low-frequency noise of thick-film resistors as quality and reliability ..."

Dubravka Rocak et al. (2001)

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DOI: 10.1016/S0026-2714(00)00255-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova:
Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectron. Reliab. 41(4): 531-542 (2001)

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