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"High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology."

Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud (2001)

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DOI: 10.1016/S0026-2714(01)00204-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/Rey-TauriacTB01a
Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud:
High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. Microelectron. Reliab. 41(9-10): 1707-1712 (2001)

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