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"Wafer Level Accelerated test for ionic contamination control on VDMOS ..."

Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud (2001)

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DOI: 10.1016/S0026-2714(01)00209-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud:
Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS. Microelectron. Reliab. 41(9-10): 1331-1334 (2001)

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