"Relevance of contact reliability in HBM-ESD test equipment."

Joachim C. Reiner, Thomas Keller (2001)

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DOI: 10.1016/S0026-2714(01)00155-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Joachim C. Reiner, Thomas Keller:
Relevance of contact reliability in HBM-ESD test equipment. Microelectron. Reliab. 41(9-10): 1397-1401 (2001)

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