"Pre-breakdown leakage current fluctuations of thin gate oxide."

Joachim C. Reiner (2003)

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DOI: 10.1016/S0026-2714(03)00267-1

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type: Journal Article

metadata version: 2020-02-22

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Joachim C. Reiner:
Pre-breakdown leakage current fluctuations of thin gate oxide. Microelectron. Reliab. 43(9-11): 1507-1512 (2003)

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