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"Impact of negative bias temperature instability on digital circuit ..."

Vijay Reddy et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.05.023

access: closed

type: Journal Article

metadata version: 2020-02-22

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Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan:
Impact of negative bias temperature instability on digital circuit reliability. Microelectron. Reliab. 45(1): 31-38 (2005)

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