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"Reliability of HTO based high-voltage gate stacks for flash memories."
Yosef Raskin et al. (2007)
- Yosef Raskin, Asaad Salameh, David Betel, Yakov Roizin:
Reliability of HTO based high-voltage gate stacks for flash memories. Microelectron. Reliab. 47(4-5): 615-618 (2007)
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