"Technology scaling implications for BTI reliability."

Stephen M. Ramey, Chetan Prasad, A. Rahman (2018)

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DOI: 10.1016/J.MICROREL.2018.01.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Stephen M. Ramey, Chetan Prasad, A. Rahman:
Technology scaling implications for BTI reliability. Microelectron. Reliab. 82: 42-50 (2018)

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