"Low cost soft error hardened latch designs for nano-scale CMOS technology ..."

Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli (2013)

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DOI: 10.1016/J.MICROREL.2013.02.012

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type: Journal Article

metadata version: 2020-02-22

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Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli:
Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation. Microelectron. Reliab. 53(6): 912-924 (2013)

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