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"The impact on power semiconductor device operation due to local electric ..."

Munaf Rahimo et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.021

access: closed

type: Journal Article

metadata version: 2022-10-02

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Munaf Rahimo, Frank Richter, Fabian Fischer, Umamaheswara Vemulapati, Arnost Kopta, Chiara Corvasce, Silvan Geissmann, Marco Bellini, Martin J. Bayer, Friedhelm Bauer:
The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. Microelectron. Reliab. 58: 51-57 (2016)

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