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"Probabilistic insight to possibility of new metal filament nucleation ..."

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey (2015)

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DOI: 10.1016/J.MICROREL.2015.06.051

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nagarajan Raghavan, Michel Bosman, Kin Leong Pey:
Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. Microelectron. Reliab. 55(9-10): 1412-1416 (2015)

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