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"A yield improvement technique in severe process, voltage, and temperature ..."

Mohsen Radfar, Jack Singh (2014)

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DOI: 10.1016/J.MICROREL.2014.07.138

access: closed

type: Journal Article

metadata version: 2020-10-26

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Mohsen Radfar, Jack Singh:
A yield improvement technique in severe process, voltage, and temperature variations and extreme voltage scaling. Microelectron. Reliab. 54(12): 2813-2823 (2014)

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